John Houghton
Lab / Office: PSC 657 / 520
Tel: 404-413-5390

Atomic Force Microscope Services
Cell, Protein and DNA Core Facilities

 

About AFM Services

Atomic Force Microscopy (AFM) provides images with atomic or near-atomic-resolution surface topography, capable of quantifying surface roughness of samples down to the angstrom-scale. In addition to presenting a surface image, AFM can also provide quantitative measurements of feature such as step heights and accurate measurments in other dimensions.
Service

The AFM gives a topological survey of molecules with nM resolution. Please follow the sample submission guidelines to prepare your sample to be analyzed using the Atomic Force Microscope. Data are reported within 2-3 business days after samples are received. Please follow the links below to view the submission guidelines:

AFM Sample Prep

User Fee

$10.00 / hour

Use of all Atomic Force Microscope

Service Fee

$20.00 / hour

Service for all Atomic Force Microscope

Training

$50.00 / hour

Training is pro- rated in 15 minute increments.

How to Request Service


Complete the service request form and submit the form to Sonja Young. Please prepare your samples according to our submission guidelines for best results. Please note that forms will not be accepted without an account number and PI signature. If you have any questions, feel free to contact either John Houghton or Sonja Young by phone or by email at jhoughton@gsu.edu. and sstovall@gsu.edu

Atomic Force Microscope Request Form


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